A wide range of optional software is available to provide additional information and analysis from the data collected by NEXIV systems.
Images captured with the NEXIV software (AutoMeasure) can be stitched together to form a larger mosaic. Images at different heights can be combined to form a 3D composite of an area of interest.
Using image analysis software from Digital Surf, France, sample surfaces can be analyzed based on ISO and the data exported from NEXIV.
Easily specify any chip or defect with just a click of the mouse on a graphical representation of a sample on the screen. It is a fast and efficient method for repetitive measurement on samples such as wafers.
A 3D CAD model can be converted to a 2D CAD (NCD) file, which may be used in NEXIV AutoMeasure to automate programming or employed for feature analysis.
If you would like further details on this product or a more in-depth description, our expert team will provide you with additional information and, if required, arrange an on-site visit. Talk to us in detail about your project and our experts will advise you on the best inspection system to meet your requirements. Please fill out the form opposite and we will get in touch with you shortly.
