Industrial Microscopes

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ECLIPSE-L300nd-l300n-l200nd-l200n_L300Na
UPRIGHT MICROSCOPES

ECLIPSE L300ND, L300N and L200ND, L200N

A range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications.

ECLIPSE-LV150NA-and-150N_LEDlamp+LV150
UPRIGHT MICROSCOPES

ECLIPSE LV150NA and LV150N

A flexible, modular, upright microscope series for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry), together with digital imaging accessories and large stage XY travels, ideal for semiconductor and material inspection activities.

ECLIPSE-LV100NDA-LV100ND_LEDlamp+LV100ND
UPRIGHT MICROSCOPES

ECLIPSE LV100NDA and LV100ND

This flexible, modular, upright microscope series, capable of extensive episcopic and diascopic optical contrast techniques and with digital imaging camera accessories, is ideal for material inspection in many industrial applications.

INVERTED MICROSCOPES

ECLIPSE MA200

The ECLIPSE MA200 is based on an innovative box design concept, delivering a flexible, modular, inverted microscope for episcopic optical contrast inspection. Together with digital imaging accessories, it is ideal for metallurgical material inspection activities in many industrial applications.

MA100N
INVERTED MICROSCOPES

ECLIPSE MA100N

A flexible, compact, affordable, modular inverted microscope for episcopic optical contrast techniques. Together with digital imaging camera accessories, it is ideal for metallurgical material inspection in many industrial applications.

ECLIPSE LV100N POL and Ci-POL

A series of polarising microscopes used to observe the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative and qualitative studies.

NWL_L200N

NWL200 Wafer Loader Series

Fully featured NWL200 series models support the full range of inspection requirements  for 6 inch (150mm) and 8 inch (200mm) diameter semiconductor wafers using optical microscope or video measurement instruments e.g. Nikon NEXIV.

Software_LV150N+DSFi3+PC

Software

NIS Elements software manages Nikon Digital Sight cameras to capture the best images for processing. It organizes images, processes them logically and in a smooth workflow.

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