NWL200 Wafer Loader Series

Nikon's innovative, fully featured NWL200 wafer loaders support comprehensive inspection of 6" (150mm) and 8" (200mm) diameter semiconductor wafers by optical microscope or video measurement systems e.g. Nikon NEXIV.
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NWL_L200N

Sophisticated, Trusted Loader for Handling a Variety of Wafers

The NWL Series is a superb line-up of semiconductor wafer loaders from Nikon capable of transferring 6″ (150mm) and 8″ (200mm) diameter wafers down to a thickness of 100 microns (option) onto Nikon Eclipse L200N and LV150N microscopes or a NEXIV VMZ-S video measuring system.

Integration with NEXIV – Video Metrology

The NWL200 wafer loader integrated alongside a Nikon NEXIV video measuring system provides high precision, accuracy and speed for semiconductor inspection in a production environment.

Product Highlights

High Reliability in Semiconductor Production

When the power supply is interrupted unexpectedly, the vacuum chuck of the macro arm remains active, allowing safe wafer removal.

Macro Inspection Functions

Semiconductor wafer front side pattern, back periphery and centre area inspection is supported. The wafer rotation speed and tilt angle are set automatically or manually.

Designed for Maximum Throughput

A fast wafer cassette elevator with a non-contact centring mechanism allows rapid, accurate wafer alignment using a multi-arm system for loading and unloading wafers with the highest precision.

Ergonomic Design

The NWL200 is designed ergonomically for easy of operation and control.

Positioned at 35 degrees to the left, wafer in-slot location and full cassette exchange is easy.

Core Features

Wafer Loader for IC Inspection NWL200 

Related Products

ECLIPSE L300ND, L300N and L200ND, L200N

Nikon's ECLIPSE L300ND, L300N and L200ND, L200NA is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications.
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NEXIV VMZ-S Series

Nikon's NEXIV VMZ-S series of video measuring systems delivers high accuracy, speed and usability for inspection applications down to the micro level.
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