A series of flexible, modular, upright microscopes for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry). Together with digital imaging accessories and large stage X-Y travels, the instruments are ideal for semiconductor and material inspection activities.
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Modular, Motorised and Manual Upright Microscopes

Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. Thanks to the modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand.

Nikon ECLIPSE LV150NA and LV150N

These microscopes with episcopic illumination are for inspection of semiconductors, industrial materials and components. They are also suited to research and development applications.

Nikon CFI60-2 Optical Series

Nikon’s innovative design enables clear imaging techniques, including high-contrast, brightfield, darkfield, polarisation (POL), interference contrast (DIC) and double beam interferometry optical contrast.

Nikon Digital Sight Cameras

The full range of Nikon’s Digital Sight cameras can capture images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens, magnification setting and light intensity when using the LV-ECON E controller.

Integration of LV150N and Wafer Loader NWL200

Nikon’s wafer loaders are well accepted and trusted across the semiconductor industry and many installations are in use today.

Product Highlights

Universal Optical Contrast Methods

Reflected light: brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence and two-beam interferometry.

Modular Component Accessories

From lamphouse to eyepiece, components are selected to match a user’s application. They include stands, stages, objectives, nosepieces, optical heads, eyepieces, digital cameras, filters and contrast technique accessories.

Intelligent Digital Communication

By means of an LV-ECON E controller, LV150NA and LV150N microscopes can detect and control the objective lens, light intensity, aperture and epi-contrast via Nikon’s NIS-Elements software. The LV150N detects and reports on the objective lens using the LV-NU5I and LV-INAD.

Ergonomic Design

Optimal positioning of operator controls and a variable angle eye-tube allow fatigue-free work. The right-way-up, right-way-around image enables raw materials, semiconductors and industrial components to be correctly observed.

Core Features

Materials and Semiconductor Substrate Inspections

Example applications include inspection of semiconductor substrates and device packaging, flat panel displays (FPD), electronic components and innovative materials using dedicated episcopic contrast techniques.

Upright Microscopes LV-N Series

Digital Sight Series

NIS Elements

NWL200 Wafer Loader Series

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NWL200 Wafer Loader Series

Nikon's innovative, fully featured NWL200 wafer loaders support comprehensive inspection of 6" (150mm) and 8" (200mm) diameter semiconductor wafers by optical microscope or video measurement systems e.g. Nikon NEXIV.
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NIS-Elements software manages Nikon Digital Sight cameras alongside Nikon microscopes to capture the best images for processing. It organises captured images and processes them logically in a smooth workflow.
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Microscope Components

Nikon's microscope components are used for integrating its microscopes into manufacturing equipment or inspection systems with a requirement for exceptionally high precision.
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