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Nikon’s Most Advanced, Modular, Ergonomic, Inverted Metallurgical Microscope
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope design allows complementary optical contrast techniques together on one microscope stand thanks to a modular component programme.
Nikon ECLIPSE MA200
Inverted microscope with episcopic illumination for inspection of industrial materials and components as well as for research and development.
Nikon CFI60-2 Optical Series
Nikon’s innovative design enables clear, high contrast brightfield, darkfield, polarisation (POL), differential interference contrast (DIC) and optical contrast imaging techniques.
Nikon Digital Sight Cameras
All Nikon’s Digital Sight cameras can capture images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens used, intermediate magnification changer and light intensity.
Universal Optical Contrast Methods
Reflected light: brightfield, darkfield, polarising (POL) and differential interference contrast (DIC) without the need for sample levelling due to the inverted microscope design.
Modular Component Accessories
From lamphouse to eyepieces, components are selected to match every user’s application, including lamphouses, stages, objectives, nosepieces, optical heads, eyepieces, digital cameras, filters and contrast technique accessories.
Intelligent Digital Communication
The MA200 detects objective lens value, magnification changer position and light intensity via Nikon software. Remote control of motorised nosepiece and light intensity is also possible.
Ergonomic Design Concept
Optimal positioning of operator controls and a variable angle eye-tube allow fatigue-free work.
Utilising a compact and efficient stand design, samples are observed without the need for pre-levelling.
Materials Research and Development
MA200 applications range from materials research and development to the production and application of innovative materials to the highest quality assurance procedures in metallurgy.
|Main Body||Focusing mechanism
Focusing nosepiece (Fixed stage) Coaxial coarse/fine adjustment knob (torque adjustable)
Coarse adjustment of 4.0 mm per rotation, fine adjustment of 0.2 mm per rotation
With flare prevention, Built-in UV cut filter
Field diaphragm: dialing continuous variable (centerable), Aperture diaphragm: dialing continuous variable (centerable)
Filter: Double turret (ND16, ND4/GIF, NCB, Additional option available), Polarizing block (Selectable with or without 1/4 Plate)
Fluorescence filter blocks: B/G/V/BV, Built in 12 V 50 W halogen lamp, C-HGFI HG Fiber Illuminator
Eyepiece tube/Back port: 100/0, 55/45
|Optics||CFI60 /CFI60-2 system|
|Observation Image||Surface Image|
|Observation Method||Bright/Darkfield/Simple Polarizing/DIC/Epi-Fluorescence|
|Resolving Nosepieces||MA2-NUI5: Bright/Darkfield/ DIC 5 position nosepiece, LV-NU5A: Motorized Bright/Darkfield/DIC 5 position nosepiece
D-NID6: Brightfield 6 position nosepiece (Intelligent), D-NI7: Brightfield 7 position nosepiece (Intelligent)
|Stage||MA-SR Rectangular 3-plate Stage
50 x 50 mm stroke (includes two stage inserts (ø20mm and 40mm opening) and coaxial control handle on the right side
Dimension: 295 x 215 mm, Stroke: 50 mm x 50 mm (with distance graduation), Standard accessory: ø22 universal specimen holder (with sample clip)
|Trinocular Eyepiece||Seidentopf, interpupillary distance adjustment 50-75 mm|
|Power Input||100-240 V, 50-60 Hz|
|Electrical Power Consumption||1.2 A 75 W|
|Weight||Approx. 26 kg (depends on combination)|
Turret (1x, 1.5x, 2x), Status detection (Output magnification information to main unit)
MA2-GR Grain Reticle (ASTM E112-63 grain sizing numbers 1 to 8), Grid Reticle (20 lines, 0.5 mm)
MA2-MR Scale Reticle (compatible with 5-100x, Read in um, Dialing System)
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