Dates:
2026:
November 3-5, 2026
Location:
*NEW LOCATION*
Nikon Metrology
9155 Cottonwood Ln. N.
Maple Grove, MN 55369
Time:
Tuesday – Thursday: 9:00 am to 5:00 pm
Course Description:
This course empowers experienced CT operators to push beyond fundamentals, refine their capabilities, and achieve a higher level of technical excellence. Advanced training is not about basics — it’s about solving the real-world challenges that make CT both powerful and complex. Every element of this course is centered on one thing: application.
Forget long hours in a classroom. You’ll be immersed in a hands-on lab environment where learning happens at the system, not the desk. Through interactive exercises, you’ll develop and refine scanning techniques, optimize reconstructions, and perform real data analysis — gaining skills you can immediately apply on the job.
Working with some of the most advanced CT equipment available, you’ll explore the practical differences between 225kV and 450kV microfocus systems. You’ll learn when to deploy advanced scanning modes, how to push hardware performance to its limits, and how to make smarter decisions before ever relying on software corrections.
By the end of the course, you won’t just understand CT better — you’ll operate with confidence, equipped with advanced tools, proven strategies, and the expertise to take on even the most demanding inspection challenges.
This course is in alignment with sections from ANSI/ASNT CP-105. Contact hours from the course may be used for certifications in alignment with NAS-410 and SNT-TC-1A. It is recommended that individuals take the 5-day DR/CT course as a prerequisite to this course.
Topics of discussion will include but are not limited to:
Technique Development
- Development around Requirements
- Balance: Contrast, Noise, Resolution, Unsharpness
- Optimizing Scan Parameters
- Scan Orientation
- Anticipating Artifacts
- Filter and Diminishing Return
- Proving Image Quality
- Speed vs. Quality of Scans
- Offset Y-Axis
- Scan Modes: Helical, Panel Shift, Tilt, etc.
Sample Examples
- High Density Materials
- Low Density inside High Density
- Regions of Interest in Circuit Boards
- Complex Geometries and Curved Surfaces
- Low Density Materials
- Additive Manufactured Parts
- and many more…
Reconstruction
- Center of Rotation Information
- Beam Hardening Correction
- Median and Enhancement Filters
- Scatter Reduction and Veiling Glare
- Flux Normalization
- Noise Reduction
Data Analysis
- Surfacing Difficult Samples (Noisy and Multi Material)
- Porosity Analysis (Low Contrast vs. High Contrast)
- Grey Scale Analysis
- GD&T
- Determining Defects and Measurement
- Use of ROIs for Targeted Analysis
- STL Creation
