More than 2,000 attendees are expected to converge at SEMICON West, including leading players in semiconductors, medical device, research and testing laboratories, and more. With the exponential growth of miniaturization across industries, the ability to measure the tiniest of features has never been of greater importance.
To address this need and demonstrate its appeal, at SEMICON West Nikon will be featuring the following groundbreaking technologies:
- X-ray Computed Tomography – Attendees are keen to achieve precise quality control, and Nikon’s X-ray CT line delivers by nondestructively uncovering hidden defects in electronic components.
- Upright Industrial Microscopes and Digital Sight Camera – With complementary optical contrast techniques on one microscope stand and episcopic illumination, Nikon’s LV upright microscope line is well-suited to the inspection of semiconductors and other tiny devices. The Digital Sight Camera is easily combined with the LV microscope of choice to adjust magnification settings and light intensity.
- Video measuring system – The NEXIV VMZ-S is the video measuring system of choice for the inspection of microelectronics. It addresses the industry’s need for speed, accurate measurement, and high throughput. The through-the-lens laser autofocus and automatic measurement capability enable superior edge detection and the inspection of other features of microelectronic components.
