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Support and Services

Brochures

Video Measuring Systems

Manual Measuring

Industrial Microscopy

General Brochures

Industrial Instruments General Catalog

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Nikon Metrology Solutions Brochure

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X-Ray CT

VOXLS 30 Series

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XT H Series

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XT H 225 ST 2x

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High.Contrast Filter

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VOXLS 40 C 450

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LiB.Overhang Analysis

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X-ray CT Inspection Services

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MCT 225

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Automated CT

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Configurable X-ray CT Systems

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XT V Series

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Laser Radar

APDIS Intelligent Quality Stations

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APDIS Gap & Flush

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APDIS Automotive

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APDIS Laser Radar

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3D Laser Scanners

LC15Dx

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Focus

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XC65Dx

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L100

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ModelMaker H120 & MCAxS

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Video Measuring Systems

VMZ-S Series

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VMA Series

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Remote Control SDK

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VMZ-H3030

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VMZ-K Series

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Manual Measuring

Measuring Microscopes MM Series

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Digimicro

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Autocollimator

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Profile Projectors

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Industrial Microscopy

Microscope Components

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NIS Elements

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Digital Cameras for Microscopes

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Wafer Loader for IC Inspection NWL200

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Upright POL Microscopes

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Inverted Microscopes MA Series

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Upright Microscopes LV-N Series

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Upright Microscopes L-Series

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Stereo Microscopes

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Case Studies

Nikon introduces fast, automated system for inspecting wafer ID codes

To assist with quality control in silicon wafer manufacturing companies, the Industrial Metrology Business Unit of Nikon Corporation (https://industry.nikon.com) offers…

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Rapid, low-cost inspection of semiconductor wafers

The introduction of a programmable video measuring system with automatic handling of semiconductor wafers by the Industrial Metrology Business Unit…

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Whether on the track or in the shop, Nikon’s Video Measuring System helps Roush Yates Engines go faster

In North American auto racing circles, any discussion about horsepower must include Roush Yates Engines, which will soon celebrate its…

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University extends Finland’s X-ray CT infrastructure

Between 1st May, 2019 and 30th April, 2022, the University of Eastern Finland established Tomolab, a new X-ray CT (computed…

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Nikon automated X-ray CT accelerates the Natural History Museum of London’s research, archiving, and industrial services

The Natural History Museum in London, UK The Natural History Museum (NHM) in London is one of the few museums…

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Video measuring machine doubles the performance of quality control of a medical product manufacturer

“We based our purchase decision on the experiences of other customers who told us that Nikon’s products provide effective…

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Microscope protects samples from contamination

A classic microscope has been replaced with a new Nikon Metrology SMZ745 binocular model with a zoom range of 0.67x to 5x and its generous working distance of 115 mm.

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Laser Scanning: The Powerful, Flexible Tool of Choice for Advanced Manufacturing

Laser scanners are remarkably efficient, flexible, and reliable measurement devices that can be combined with localizing technology in a variety…

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Automatic video inspection of semiconductor wafers accelerates quality control and reporting

Semikron Elektronik GmbH used several optical microscopes from Nikon Metrology to survey and inspect 6-inch semiconductor wafers for quality assurance and production optimization.

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3D laser scanning helps research institute to verify accuracy of additively manufactured parts

Established in 1984, Neuchatel-based Centre Suisse d’Electronique et de Microtechnique is now one of…

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Software

Industrial Microscopes

Stereo Microscopes

Imaging Software

Cameras for Microscopes

Accessories

Multiple Products

X-ray CT / 3D Laser Scanners / Laser Radar

Industrial Microscopes

ECLIPSE MA200

Setup Tool Ver1.2.1 (32bit)

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ECLIPSE MA200

Setup Tool Ver1.2.1 (64bit)

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LV Series

Support Tools Ver2.3.3 (64bit)

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ECLIPSE L300N/ L300ND/L200N/L200ND

Setup Tool Ver1.2.1 (32bit)

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ECLIPSE L300N/ L300ND/L200N/L200ND

Setup Tool Ver1.2.1 (64bit)

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Stereo Microscopes

SMZ25/SMZ18 /SMZ1270i

Control Software SMZ Support Tools V1.4.0 (64bit)

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Imaging Software

NIS-Elements Viewer

Ver4.11.00 (Mac)

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NIS-Elements Viewer

Ver5.21.00 (Windows)

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NIS-Elements L

KsCam.dll Ver9.1.2.3

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NIS-Elements L

Ver1.21.00 (64bit)

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NIS-Elements F

Ver4.60.00 (64bit)

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NIS-Elements F

Ver5.21.00 (64bit)

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NIS-Elements F

Ver5.22.00 (64bit)

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NIS-Elements F

Ver5.42.00 (64bit)

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NIS-Elements F

Ver5.42.01 64bit

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NIS-Elements D

Ver5.02.03 (64bit)

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NIS-Elements D

Ver5.11.03 (64bit)

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NIS-Elements D

Ver5.11.03 Patch01 (64bit)

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NIS-Elements D

Ver5.21.03 (64bit)

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NIS-Elements D

Ver5.30.05 (64bit)

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NIS-Elements D

Ver5.42.01 (64bit)

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NIS-Elements D

Ver5.42.01 Device Updater 64bit

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NIS-Elements D

Ver6.01.00 (64bit)

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NIS-Elements BR

Ver5.02.03 (64bit)

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NIS-Elements BR

Ver5.11.03 (64bit)

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NIS-Elements BR

Ver5.11.03 Patch01 (64bit)

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NIS-Elements BR

Ver5.21.03 (64bit)

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NIS-Elements BR

Ver5.30.05 (64bit)

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NIS-Elements BR

Ver5.42.01 (64bit)

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NIS-Elements BR

Ver5.42.01 Device Updater 64bit

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NIS-Elements BR

Ver6.01.00 (64bit)

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NIS-Elements AR

Ver5.02.03 (64bit)

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NIS-Elements AR

Ver5.11.03 (64bit)

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NIS-Elements AR

Ver5.11.03 Patch01 (64bit)

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NIS-Elements AR

Ver5.21.03 (64bit)

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NIS-Elements AR

Ver5.30.05 (64bit)

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NIS-Elements AR

Ver5.42.00 (64bit)

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NIS-Elements AR

Ver5.42.01 (64bit)

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NIS-Elements AR

Ver5.42.01 Device Updater 64bit

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NIS-Elements AR

Ver6.01.00 (64bit)

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Cameras for Microscopes

Digital Sight Series

Control Software NIS-Elements F Ver2.21 (English version)

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Digital Sight Series

Firmware DS-Qi2 Ver1.03

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Digital Sight Series

Application DS-L4 Viewer Ver1.0.2 (Mac)

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Digital Sight Series

DS-L4 Viewer Ver1.0.2 (Windows)

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Digital Sight Series

Firmware DS-Qi2 Ver2.00

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Digital Sight Series

Firmware DS-Ri2 Ver2.00

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Digital Sight Series

Firmware DS-Qi2 Ver2.10

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Digital Sight Series

Firmware DS-Ri2 Ver2.10

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Digital Sight Series

Application DS-L4 Ver1.1.0

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Digital Sight Series

Firmware DS-Fi3 Ver1.10

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Digital Sight Series

Firmware DS-Qi2 Ver2.11

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Digital Sight Series

Firmware DS-Ri2 Ver2.11

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Digital Sight Series

Application DS-L4 Ver1.2.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Mac)

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Windows)

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Android)

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Digital Sight Series

Application DS-L4 Ver1.3.0

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Digital Sight Series

Application DS-L4 Ver1.4.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Mac)

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Windows)

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.1 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.1

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Digital Sight Series

Application DS-L4 Ver1.5.2

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Digital Sight Series

Application DS-L4 Ver1.5.3

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.2 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.4

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Digital Sight Series

Application DS-L4 Ver1.5.5

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Digital Sight Series

Application DS-L4 Ver1.5.6

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Digital Sight Series

Application DS-L4 Ver1.5.7

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Digital Sight Series

Application DS-L4 Ver1.5.8

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Digital Sight Series

Application DS-L4 Ver1.5.11

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Digital Sight Series

Digital Sight 1000 Ver3.18

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Digital Sight Series

Digital Sight 1000 Ver3.18

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Digital Sight Series

Digital Sight 10 Ver1.20

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Digital Sight Series

Digital Sight 10 Ver1.30

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Digital Sight Series

Digital Sight 50M Ver1.30

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Accessories

HG Precentered Fiber Illuminator

Control software Fiber Controller (Ver1.0.1)

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Multiple Products

Microscope USB Communication Driver

micusb Ver3.0.1.13 (64bit)

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Microscope USB Communication Driver

micusb Ver3.0.1.14 (64bit)

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X-ray CT / 3D Laser Scanners / Laser Radar

NM API Metrolog

License file (.zip, 1kb)

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NM API Polyworks

License file (.zip, 1kb)

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NM API CAMIO-Lizenz

(.zip, 1kb)

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Licensing Installer

NMLicensingInstaller Ver2.2 (msi-file, 54mb)

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X-ray CT

Laser Radar

3D Laser Scanners

Video Measuring Systems

Manual Measuring

Industrial Microscopy

X-ray CT

Laser Radar

3D Laser Scanners

Video Measuring Systems

Manual Measuring

Industrial Microscopy

Download Center

Brochures

General Brochures

X-Ray CT

Laser Radar

3D Laser Scanners

Video Measuring Systems

Manual Measuring

Industrial Microscopy

Case Studies

Nikon introduces fast, automated system for inspecting wafer ID codes

Rapid, low-cost inspection of semiconductor wafers

Whether on the track or in the shop, Nikon’s Video Measuring System helps Roush Yates Engines go faster

University extends Finland’s X-ray CT infrastructure

Nikon automated X-ray CT accelerates the Natural History Museum of London’s research, archiving, and industrial services

Video measuring machine doubles the performance of quality control of a medical product manufacturer

Microscope protects samples from contamination

Laser Scanning: The Powerful, Flexible Tool of Choice for Advanced Manufacturing

Automatic video inspection of semiconductor wafers accelerates quality control and reporting

3D laser scanning helps research institute to verify accuracy of additively manufactured parts

Software

Industrial Microscopes

Stereo Microscopes

Imaging Software

Cameras for Microscopes

Accessories

Multiple Products

X-ray CT / 3D Laser Scanners / Laser Radar