Nikon Metrology’s Microscopy Business Unit is proud to announce its participation in the W3+ Fair in Jena this September. As a leading event for photonics, optics, electronics, and precision engineering, the W3+ Fair provides an ideal platform for Nikon to showcase its latest microscopy innovations and connect with industry experts, researchers, and partners.
During the event, the team will highlight advanced imaging solutions designed to support cutting‑edge applications in manufacturing and materials analysis. By joining this high‑tech gathering in Jena, Nikon Metrology reaffirms its commitment to driving technological progress and fostering collaboration within Europe’s thriving innovation ecosystem.
Nikon Metrology and Nikon Corp join together to exhibit at this show to showcase Nikon’s strength in optical technologies and materials, components and systems, Rayfact lenses and other objectives.
Meet our experts in at Stand C15a to see how industrial technologies, components and systems can benefit your applications and workflows.
