Advancing Semiconductor Measurement and Inspection
Nikon Metrology is pleased to announce its participation in SEPEM Industries Grenoble 2026, where we will showcase advanced optical measurement solutions designed to meet the growing demands of semiconductor and high-technology manufacturing.
Visit us at Stand A18 to discover how precision measurement technologies can help improve quality control, process reliability, and manufacturing efficiency across semiconductor and microelectronics applications.
Discover Our Measurement Solutions
Nikon NEXIV VMZ-S Video Measuring System
The NEXIV VMZ-S combines high-precision optics, intelligent automation, and intuitive measurement software to deliver fast and reliable dimensional inspection of complex components.
Visitors will see how the system supports:
- High-accuracy dimensional measurement
- Automated inspection workflows
- Measurement of miniature and complex features
- Increased productivity and repeatability
The VMZ-S is particularly well suited for semiconductor, electronics, precision engineering, and advanced manufacturing applications where accuracy and throughput are critical.
Nikon Measuring Microscope
Alongside the VMZ-S, Nikon Metrology will demonstrate a Nikon Measuring Microscope, offering exceptional image quality and precise measurement capabilities for inspection, quality assurance, failure analysis, and research applications.
The system provides an ideal solution for the examination and measurement of small components and features commonly found in semiconductor and microelectronic devices.
Focus on the Semiconductor Industry
The Grenoble region is recognized as one of Europe’s leading semiconductor and microelectronics hubs. As devices continue to become smaller and more complex, manufacturers require measurement technologies capable of delivering reliable results at increasingly tight tolerances.
At SEPEM Grenoble, our experts will demonstrate how Nikon Metrology solutions support:
- Wafer and substrate inspection
- Semiconductor packaging applications
- Microelectronic component measurement
- Failure analysis and quality control
- Research and development activities
- Process optimization and traceability
Whether you work in semiconductor manufacturing, electronics production, research, or quality assurance, our team will be available to discuss your specific measurement challenges.
Meet Our Experts
Our technical specialists will be present throughout the exhibition to provide live demonstrations, answer questions, and discuss how Nikon Metrology’s optical measurement solutions can help improve inspection and quality processes within your organization.
We look forward to welcoming you to Stand A18 and discussing how Nikon Metrology’s precision measurement solutions can support the future of semiconductor manufacturing and innovation.
