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MM-400 and MM-800 Series
High Precision Construction for More Accurate Measurement
MM-400 and MM-800 Series microscopes operate within a digital control system, providing excellent measurement accuracy for industrial in-line and quality assurance applications. The instruments are ideal for inspecting, measuring and verifying both 2D and 3D features across a wide range of components.
Nikon MM-400 and MM-800 Series
The MM-400 and MM-800 Series measures components across many industries, including these examples: electronics, wire-bond wire heights, connector pins and sockets.
Compact, Long-Working-Distance, High-Performance Objective Design
Nikon’s lenses offer superior performance with very long working distances, excellent high-contrast, flat-field images and reduced errors due to their telecentric design.
Nikon’s CFI60-2 Objective System Capabilities
Nikon’s innovative optics enable clear, high-contrast brightfield, darkfield, polarised (POL) and differential interference contrast (DIC) images for precise, accurate measurement of low contrast features.
Wide Range of Measuring Stages
Six robust stages are available for the MM-800, ranging from 12” x 8” (300 mm x 200 mm) down to 2” x 2” (50 mm x 50 mm), of which the three smaller stages up to 6″ x 4″ (150 mm x 100 mm) are compatible with the MM-400.
Robust, Precision Build for Repeatable Accuracy
High precision and repeatability as well as accurate results are guaranteed throughout the long service life of the instruments, supported by an extensive range of optical components and accessories.
Two Optical Systems
The outstanding modular range allows the user to optimise measurement performance by configuring exactly the right accessories to achieve an efficient and effective inspection process.
MM Controller Backpack Interface
LED illumination settings, XY-stage co-ordinates and Z-axis data are transferred to the MM controller and Nikon’s E-Max software on a PC for full data processing and system control.
Optional Focusing-Aid (FA) Capability
Projected patterns enable accurate, repeatable focusing for excellent Z-axis measurement. Errors due to depth of focus variations are minimised and multiple operators achieve the same results.
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