SEMICON Europa 2026

Nikon Metrology is excited to announce its participation in SEMICON Europa 2026, one of Europe's leading events for the semiconductor industry.
November 10 – 13, 2026
Tuesday, November 10th: 9:00AM – 6:00PM Wednesday, November 11th: 9:00AM – 6:00PM Thursday, November 12th: 9:00AM – 6:00PM Friday, November 13th: 9:00AM – 4:00PM
Messe München, Munich, Germany

Discover Advanced Solutions for Semiconductor Inspection, Measurement and Analysis 

Nikon Metrology is excited to announce its participation in SEMICON Europa 2026, one of Europe’s leading events for the semiconductor industry. This year, Nikon Metrology will be joined by Nikon Precision, bringing together a comprehensive portfolio of solutions that support semiconductor manufacturing, inspection, metrology, failure analysis, and process optimization. 

Visit us at Hall B1, Stand 117 to explore the latest innovations designed to help manufacturers improve quality, increase efficiency, and meet the growing demands of advanced semiconductor production. 

Technologies on Display 

NEXIV VMS-Z Video Measuring System 

The NEXIV VMZ-S combines high-precision optics, automation, and intelligent measurement software to deliver fast and reliable dimensional measurements of semiconductor and microelectronic components. The system is ideal for inspecting miniature and complex features while ensuring repeatable and accurate results. 

Applications include: 

  • Semiconductor packaging inspection 
  • Lead frame and connector measurement 
  • Precision electronic components 
  • R&D and process validation 

ECLIPSE LV100AMS Automated Microscope 

The ECLIPSE LV100AMS is Nikon’s fully automated, AI-powered industrial microscope, designed to deliver fast, consistent inspection results with minimal operator input. Combining automated image acquisition, intelligent analysis, and report generation in a single workflow, it is ideal for semiconductor inspection, failure analysis, and quality control applications. The system’s one-click inspection capabilities help improve productivity, repeatability, and process reliability.  

Key benefits: 

  • AI-powered automated inspection 
  • One-click image acquisition and analysis 
  • Reduced operator influence and improved consistency 
  • Ideal for semiconductor quality control and failure analysis 
  • Automated reporting for streamlined workflows  

ECLIPSE L200N with Nikon Wafer Loader 

Experience automated wafer inspection with the ECLIPSE L200N combined with the Nikon Wafer Loader. 

This powerful solution streamlines wafer handling and inspection workflows, helping manufacturers improve throughput, consistency, and productivity while reducing manual intervention. 

Key benefits include: 

  • Automated wafer handling 
  • Improved process efficiency 
  • Enhanced repeatability 
  • Increased inspection throughput 

SMZ25 Stereo Microscope 

The SMZ25 Stereo Microscope offers exceptional zoom performance and image quality for semiconductor inspection and failure analysis applications. 

Its large zoom range enables users to transition seamlessly from general overviews to detailed inspections of miniature features, making it an invaluable tool for laboratories, R&D teams, and production environments. 

Nikon X-ray CT System 

See how Nikon’s advanced X-ray CT technology enables non-destructive inspection of internal structures that cannot be examined using optical methods alone. 

The system provides detailed 3D visualization and analysis for: 

  • Semiconductor package inspection 
  • Void and defect detection 
  • Failure analysis 
  • Process optimization 
  • Quality assurance 

Focus on Semiconductor Innovation 

As semiconductor devices continue to shrink in size while increasing in complexity, manufacturers require highly accurate and reliable inspection technologies throughout the production process. 

At SEMICON Europa 2026, Nikon Metrology and Nikon Precision will demonstrate solutions supporting: 

  • Wafer manufacturing and inspection 
  • Advanced semiconductor packaging 
  • Process control and quality assurance 
  • Materials and defect analysis 
  • Failure analysis and troubleshooting 
  • Research and development 

Whether you are involved in semiconductor fabrication, microelectronics, advanced packaging, research, or quality control, our experts will be available to discuss your specific challenges and application requirements. 

Meet the Experts 

Our specialists in semiconductor manufacturing, microscopy, metrology, and X-ray CT inspection will be available throughout the exhibition to provide live demonstrations, answer technical questions, and discuss solutions tailored to your applications. 

Event Details

Event Location
Messe München, Munich, Germany
Event Type
Live Event
Event Date
November 10 – 13, 2026
Event Times
Tuesday, November 10th: 9:00AM – 6:00PM Wednesday, November 11th: 9:00AM – 6:00PM Thursday, November 12th: 9:00AM – 6:00PM Friday, November 13th: 9:00AM – 4:00PM
Stand Number
Hall B1, Stand 117
Speaker Name
David Flemming, Oliver Sowa, Philipp Wachenfeld, Timo Körmendy, Oliver Günnewig, Merten Kuna, Sergei Kolobov
Share Event

Other Upcoming Events

France
October 14th + 15th, 2026

Mesures Solutions Expo 2026

Germany
September 23 - 24, 2026

W3 + Fair Convention 2026

Nikon Metrology
Turkey
November 4 - 7, 2026

Kalite 2026