Mesures Solutions Expo 2026

Nikon Metrology is pleased to announce its participation in Mesures Solutions Expo 2026, one of France's leading trade shows dedicated to measurement and inspection technologies.
October 14th + 15th, 2026
Wednesday 14 October 2026: 9 am – 6 pm Thursday 15 October 2026: 9 am – 5 pm
Cité des Congrès, Lyon, France

Discover Advanced Semiconductor Measurement Solutions

Nikon Metrology is pleased to announce its participation in Mesures Solutions Expo 2026, one of France’s leading trade shows dedicated to measurement and inspection technologies. Taking place on 14 and 15 October 2026 at the Cité des Congrès in Lyon, the event brings together measurement professionals, industry experts, and technology innovators from across Europe.

Join our team to explore the latest advancements in precision optical metrology, with a special focus on the semiconductor industry and high-accuracy measurement applications.

What You’ll See on Our Stand

Nikon NEXIV VMF-K Video Measuring Series

Designed for demanding inspection and measurement tasks, the Nikon VMF-K Series combines high-precision optics with exceptional ease of use. Visitors will discover how the system supports accurate measurement and analysis of semiconductor components, electronic devices, and other miniature features requiring micron-level precision.

Nikon Measuring Microscopes

Our specialists will also showcase Nikon’s range of measuring microscopes, demonstrating how manufacturers, research laboratories, and quality control teams can achieve reliable dimensional measurements while improving inspection workflows and productivity.

Focus on Semiconductor Applications

As semiconductor devices continue to become smaller and more complex, precision measurement plays a critical role in ensuring quality and process control. At Mesures Solutions Expo, Nikon Metrology will demonstrate how its optical measurement technologies help manufacturers:

  • Inspect miniature features with high accuracy
  • Improve quality assurance processes
  • Increase measurement repeatability
  • Support R&D and failure analysis activities
  • Meet demanding semiconductor and microelectronics requirements

Whether you are involved in wafer processing, electronic packaging, microelectronics, or advanced manufacturing, our experts will be available to discuss your specific measurement challenges and applications.

Meet the Experts

Our technical and application specialists will be on hand throughout the event to answer questions, provide live demonstrations, and discuss how Nikon Metrology solutions can support your inspection and measurement objectives.

Event Details

Event Location
Cité des Congrès, Lyon, France
Event Type
Live Event
Event Date
October 14th + 15th, 2026
Event Times
Wednesday 14 October 2026: 9 am – 6 pm Thursday 15 October 2026: 9 am – 5 pm
Stand Number
C06
Speaker Name
Christophe Thubert, Charly Philippe, Gianluca Santoni
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