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    • XT H Series
    • Configurable Large Envelope X-ray and CT Systems
    • VOXLS 30 Series X-ray and CT Systems
    • XT V 130 and XT V 160
      • Non-Electronics Applications for XT V Series
    • Automated CT Inspection Enables Zero Defect Production
    • X-ray Source Technology
    • Inspect-X for 3D CT
    • Inspect-X for XT V Series
    • LiB.Overhang Analysis
  • Laser Radar
    • APDIS MV4x0 Laser Radar
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    • APDIS Gap & Flush System
    • APDIS in Automotive
  • Video Measuring Systems
    • NEXIV VMZ-NWL200
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    • Software for Video Measuring Systems
      • NEXIV AutoMeasure v14
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      • Optional Software
  • Manual Measuring
    • Measuring Microscopes
      • MM-400N and MM-800N Series
      • Software and Data Processing
      • Accessories for MM-400N and MM-800N Series
        • Rotating Tables for X/Y Manual Measuring Stages
        • X/Y Manual Measuring Stages
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      • Autocollimators 6B-LED and 6D-LED
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  • Industrial Microscopy
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      • SMZ25 and SMZ18
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      • ECLIPSE L300ND, L300N and L200ND, L200N
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      • ECLIPSE LV100N POL and Ci-POL
      • NWL200 Wafer Loader Series
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