Nikon Metrology will attend Germany’s Productronica in November this year, where our X-ray CT experts will be on-site to answer questions and present live XTV system demonstrations at our stand.
A major trade fair focused on technologies, solutions, and trends in electronics manufacturing initially launched in 1975, Productronica has provided the electronics production sector with its own comprehensive platform for five decades. The fair covers the electronics production value chain, from components to assembly, and features focused forums, live demos, and exhibits of the latest production technologies and innovations.
The event will take place from November 14th to 17th at Messe Munich, Germany, showcasing the latest innovations in the electronics industry, from PCB to micro and nano productions.
Nikon’s XT V range comprises world-class X-ray and CT systems for non-destructive inspection of electronic components (PCBs, BGAs, chips and much more). With sub-micron feature recognition, the XT V system range meets today’s need for high-performance, non-destructive inspection of complex electronic components. Nikon’s Xi Nanotech X-ray source paired with industry-leading flat panel detectors produces best-in-class image quality, with seamless transition between 2D and 3D inspection.
Nikon’s Microscopy & NEXIV team will also be available to take questions at Semicon Europa in Hall B1, booth 754.