Nikon’s NEXIV VMF-K Series enhances measurement speed for precision inspection

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Nikon has introduced the NEXIV VMF-K Series, a high-performance video measuring system that significantly improves measurement throughput. TOKYO – Nikon…
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Nikon divests laser scanner division in deal with UK’s LK Metrology

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Nikon streamlines its portfolio by selling its laser scanning business to long-time collaborator LK Metrology, ensuring continued development of its…
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Internal engine parts can be complex, making measurement and inspection a challenge. Nikon’s video measuring system provided RYE with massive time savings and a marked improvement in accuracy

Nikon Showcases Video Measurement Innovation at Metrologists Congress 2024

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Nikon Metrology demonstrated its industry-leading solutions at the Metrologists Congress 2024. This year’s event was held in Palić, Serbia, and…
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Nikon’s Scatter Correction CT addresses X-ray scatter artifacts in industrial CT scanning

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Nikon has announced the launch of Scatter Correction CT, a software solution that enhances image quality and measurement accuracy in…
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Nikon’s APDIS Laser Radar aligns with new VDA standards for automotive metrology

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Leuven, Belgium – Nikon Metrology NV (Nikon Metrology), a subsidiary of Nikon Corporation (Nikon), a supplier of traceable shop floor…
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Nikon’s AI Reconstruction draws on Deep Learning to deliver faster, clearer CT scans

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Nikon IMBU (https://industry.nikon.com) has released AI Reconstruction, an innovative 3D computed tomography (CT) reconstruction software solution powered by artificial intelligence…
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Nikon teaching microscopes o enhance student learning in universities

Europe’s first 5G interactive microscope labs enable students to get up close with science

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The University of Plymouth has become home to the first 5G interactive microscope labs in Europe. The facility will transform…
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Nikon expands X-ray CT system range with the introduction of the VOXLS 30 Series

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Nikon IMBU (https://industry.nikon.com) has launched three new models in its VOXLS range of X-ray CT (computed tomography) systems for non-destructive…
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Tilted CT improves X-ray inspection of components that are flat or contain high density areas

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A pioneering X-ray computed laminography (CL) technique has been introduced by the Industrial Metrology Business Unit of Nikon Corporation (https://industry.nikon.com)…
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Wafer automatic measurement solution supports the measurement required for back-end process control

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The Industrial Metrology Business Unit of Nikon Corporation has released the automatic wafer measurement system NEXIV VMZ-NWL 200 to solve the…
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