Nikon Corporation (Nikon) has announced a comprehensive suite of enhancements to its XT V Series X-ray and CT systems, strengthening the platform’s position as a world-class solution for non-destructive inspection of electronic components. These enhancements enable operators to achieve better image quality, scan heavier samples, and protect sensitive components from electrostatic discharge and radiation damage.
A software enhancement and five hardware enhancements are available as optional upgrades to the XT V Series, allowing customers to customise their systems based on their specific application requirements.
Software Enhancement:
- High Contrast Filter 2.0: Offers consistently clear imaging that ensures defects are visible immediately, for any combination of sample shape and density.
Hardware Enhancements:
- Heavy Duty Tray: Enables larger, heavier parts to be scanned. Operators can scan more parts in each batch and expand inspection capabilities.
- Diamond Window: Delivers improved image contrast across the operating range, particularly beneficial for low-density and mixed-material samples, resulting in less noise and faster scans.
- Low-Dose Collimator: Protects radiation-sensitive electronics, minimising dose to sensitive parts such as semiconductor devices while enabling safe inspection of larger batches.
- ESD Safety Upgrade: Provides ESD-safe inspection of sensitive electronic components to IEC 6100-4-2, ANSI/ESD S20.20, and JEDEC JESD625 standards when installed in an ESD-Protected Area (EPA), allowing for confident integration into ESD-safe processes.
- High Magnification CT Arm: Enables higher magnification CT scans for small samples, allowing operators to see finer details than previously possible.
The XT V Series continues to excel in electronics inspection applications, including PCBs, BGAs, chips, and semiconductor devices. The systems maintain their market-leading Xi microfocus X-ray sources and powerful image enhancement capabilities, while the new enhancements provide additional value for customers across electronics manufacturing, semiconductor production, and quality control environments.
More information about the enhanced XT V Series is available on Nikon’s website.
On behalf of:
Nikon Metrology Europe NV
Interleuvenlaan 86, 3001 Leuven, Belgium.
Contact: Mona Noujeim, X-ray Marketing Manager Europe
Tel: +32 16 74 01 01
Email: [email protected]
Web: www.industry.nikon.com
