A classic microscope has been replaced with a new Nikon Metrology SMZ745 binocular model with a zoom range of 0.67x to 5x and its generous working distance of 115 mm.
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Case Studies
Laser Scanning: The Powerful, Flexible Tool of Choice for Advanced Manufacturing
Laser scanners are remarkably efficient, flexible, and reliable measurement devices that can be combined with localizing technology in a variety…
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Automatic video inspection of semiconductor wafers accelerates quality control and reporting
Semikron Elektronik GmbH used several optical microscopes from Nikon Metrology to survey and inspect 6-inch semiconductor wafers for quality assurance and production optimization.
3D laser scanning helps research institute to verify accuracy of additively manufactured parts
Established in 1984, Neuchatel-based Centre Suisse d’Electronique et de Microtechnique is now one of…
A need for speed
Roush Yates Engines achieves rapid non-contact inspection with iNEXIV VMA-4540 In 2003, Jack Roush and Robert Yates partnered with Ford…
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Nikon’s camera and optics technology are an ideal combination for applied research tasks
The ability of Nikon Corporation to supply both globally renowned digital cameras, alongside high-end optics made…
X-ray technology inspires new book on plant life
Industrial X-ray equipment from Nikon Metrology “just works and works with very little fuss, even after seven years”, allowing Norwegian flora to be seen in a new light – literally.
