XT H Series

Nikon's adaptable microfocus CT systems provide high-resolution inspection of components, ranging from tiny plastic connectors to aluminium castings, for R&D, failure analysis and production quality control.

Adaptable Solutions for the Most Demanding Inspection Applications

These systems combine the adaptability needed in the lab with unique features like 225 kV Rotating.Target 2.0, Half.Turn CT acquisition mode and Auto.Filament Control to shorten cycle time and improve uptime when used for shop floor series inspection.

Product Highlights

Flexibility When You Need It

With the choice of source, targets, CT scanning strategies and options such as motorised source-to-detector distance adjustment, the XT H systems are versatile and accommodate a wide range of inspection tasks.

X.Tend Helical CT

Tall objects can be scanned in a single acquisition process, eliminating artifacts introduced by the cone beam and multi-scan stitching. This also provides the added benefit of scanning objects at higher magnification resulting in significantly higher resolution.

Unique 225 kV Rotating.Target 2.0

Allows continuous operation up to 450W with up to three times higher resolution for the same power, or three times faster data collection for a given resolution.

Core Features

Industries

XT H Series

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XT H 225 ST 2x

automated-ct-cover

Automated CT

MCT225

X-ray CT Inspection Services

nikon-metrology-x-ray-xth225-xt-h-225nikon-metrology-x-ray-xth225-mct-225
XT H 225
For inspection of small to medium parts
XT H 225 ST 2x
Flexible system for a variety of applications
MCT225
High accuracy X-ray CT metrology
Part size Part size Part size
Part density Part density Part density
Accuracy Accuracy Accuracy
Power Power Power
Versatility Versatility Versatility
Footprint Footprint Footprint

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