Resource Centre

Welcome to our resource centre. Browse and download the latest brochures and case studies. Are you interested in our software? Please fill out the form to request access.

Support and Services

Brochures

General Brochures

X-Ray CT

Laser Radar

Video Measuring Systems

Manual Measuring

Industrial Microscopy

General Brochures

Industrial Instruments General Catalogue

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Nikon Metrology Solutions Brochure

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X-Ray CT

VOXLS 40 C 450

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XT H Series

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VOXLS 30 Series

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XT H 225 ST 2x

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XT V Series

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High.Contrast Filter

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LiB Overhang Analysis

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X-ray CT Inspection Services

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MCT 225

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Automated CT

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Configurable X-ray CT Systems

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Laser Radar

APDIS Intelligent Quality Stations

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APDIS Gap & Flush

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APDIS Automotive

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APDIS Laser Radar

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Video Measuring Systems

VMF-K Series

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VMZ-S Series

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VMA Series

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Remote Control SDK

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VMZ-H3030

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Manual Measuring

Digimicro

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Autocollimator

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Profile Projectors

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Measuring Microscopes MM Series

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Industrial Microscopy

Microscope Components

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NIS Elements

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Digital Cameras for Microscopes

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Wafer Loader for IC Inspection NWL200

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Upright POL Microscopes

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Inverted Microscopes MA Series

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Upright Microscopes LV-N Series

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Upright Microscopes L-Series

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Stereo Microscopes

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Case Studies

REM Surface Engineering smooths out issues using Nikon’s micro X-ray CT scanning

REM Surface Engineering turned to Nikon and its high-resolution X-ray technologies to discover internal defects and surface roughness in parts…

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Nikon’s MCT225 brings CT clarity to Tamron’s lens analysis

Nikon’s X-ray computed tomography (CT) technology has enabled digital camera lens brand heavyweight Tamron to gain unprecedented insights into the…

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Nikon’s MCT225 X-ray technologies transform Tochigi Nikon’s plastic moulding

X-ray computed tomography (CT) technology provided by Nikon has enabled optical components production powerhouse Tochigi Nikon to unlock a game-changing…

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IntriPlex Technologies' headquarters building in Santa Barbara, California.

Nikon’s iNEXIV video measuring system gets the stamp of approval from IntriPlex Technologies

Nikon’s iNEXIV VMA-2520 video measuring system – the company’s latest addition to its industry-defining metrology solutions – has empowered IntriPlex,…

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Korean steelmaker’s R&D centre invests in X-ray CT for vehicle weld inspection

One of the world’s largest steelmaking companies, POSCO, has invested in an X-ray CT (computed tomography) system for its research…

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Nikon introduces fast, automated system for inspecting wafer ID codes

To assist with quality control in silicon wafer manufacturing companies, the Industrial Metrology Business Unit of Nikon Corporation (https://industry.nikon.com) offers…

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Rapid, low-cost inspection of semiconductor wafers

The introduction of a programmable video measuring system with automatic handling of semiconductor wafers by the Industrial Metrology Business Unit…

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Whether on the track or in the shop, Nikon’s Video Measuring System helps Roush Yates Engines go faster

In North American auto racing circles, any discussion about horsepower must include Roush Yates Engines, which will soon celebrate its…

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University extends Finland’s X-ray CT infrastructure

Between 1st May, 2019 and 30th April, 2022, the University of Eastern Finland established Tomolab, a new X-ray CT (computed…

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Integrated circuits inspected faster and more accurately with a Nikon microscope

Headquartered in Cambridge, UK and with a production facility 200 miles north in Sedgefield, PragmatIC Semiconductor (www.pragmaticsemi.com) is a world…

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White Papers

Laser Radar heralds a paradigm shift in automotive metrology

The latest version, APDIS, is a significant step forward in the evolution of the technology and is especially well suited to use in the automotive industry...

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APDIS Laser Radar: a paradigm shift away from CMMs for absolute non-contact measurement

APDIS competes even more effectively with the coordinate measuring machine (CMM) in terms of the precision with which components can be inspected...

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Software

Industrial Microscopes

Stereo Microscopes

Imaging Software

Cameras for Microscopes

Accessories

Multiple Products

Industrial Microscopes

ECLIPSE MA200

Setup Tool Ver1.2.1 (32bit)

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ECLIPSE MA200

Setup Tool Ver1.2.1 (64bit)

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LV Series

Support Tools Ver2.3.3 (64bit)

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ECLIPSE L300N/ L300ND/L200N/L200ND

Setup Tool Ver1.2.1 (32bit)

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ECLIPSE L300N/ L300ND/L200N/L200ND

Setup Tool Ver1.2.1 (64bit)

Download

Stereo Microscopes

SMZ25/SMZ18 /SMZ1270i

Control Software SMZ Support Tools V1.4.0 (64bit)

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Imaging Software

NIS-Elements Viewer

Ver5.22.00 (Windows)

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NIS-Elements L

Ver1.22.00 (64bit)

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NIS-Elements F

Ver4.60.00 (64bit)

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NIS-Elements F

Ver5.21.00 (64bit)

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NIS-Elements F

Ver5.22.00 (64bit)

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NIS-Elements F

Ver5.42.07 64bit

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NIS-Elements D

Ver5.02.03 (64bit)

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NIS-Elements D

Ver5.11.03 (64bit)

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NIS-Elements D

Ver5.11.03 Patch01 (64bit)

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NIS-Elements D

Ver5.21.03 (64bit)

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NIS-Elements D

Ver5.30.05 (64bit)

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NIS-Elements D

Ver5.42.06 (64bit)

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NIS-Elements D

Ver6.10.00 (64bit)

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NIS-Elements BR

Ver5.02.03 (64bit)

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NIS-Elements BR

Ver5.11.03 (64bit)

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NIS-Elements BR

Ver5.11.03 Patch01 (64bit)

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NIS-Elements BR

Ver5.21.03 (64bit)

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NIS-Elements BR

Ver5.30.05 (64bit)

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NIS-Elements BR

Ver5.42.06 (64bit)

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NIS-Elements BR

Ver6.10.00 (64bit)

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NIS-Elements AR

Ver5.02.03 (64bit)

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NIS-Elements AR

Ver5.11.03 (64bit)

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NIS-Elements AR

Ver5.11.03 Patch01 (64bit)

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NIS-Elements AR

Ver5.21.03 (64bit)

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NIS-Elements AR

Ver5.30.05 (64bit)

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NIS-Elements AR

Ver5.42.06 (64bit)

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NIS-Elements AR

Ver6.10.00 (64bit)

Download

Cameras for Microscopes

Digital Sight Series

Control Software NIS-Elements F Ver2.21 (English version)

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Digital Sight Series

Firmware DS-Qi2 Ver1.03

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Digital Sight Series

Application DS-L4 Viewer Ver1.0.2 (Mac)

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Digital Sight Series

DS-L4 Viewer Ver1.0.2 (Windows)

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Digital Sight Series

Firmware DS-Qi2 Ver2.00

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Digital Sight Series

Firmware DS-Ri2 Ver2.00

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Digital Sight Series

Firmware DS-Qi2 Ver2.10

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Digital Sight Series

Firmware DS-Ri2 Ver2.10

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Digital Sight Series

Application DS-L4 Ver1.1.0

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Digital Sight Series

Firmware DS-Fi3 Ver1.10

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Digital Sight Series

Firmware DS-Qi2 Ver2.11

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Digital Sight Series

Firmware DS-Ri2 Ver2.11

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Digital Sight Series

Application DS-L4 Ver1.2.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Mac)

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Windows)

Download

Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Android)

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Digital Sight Series

Application DS-L4 Ver1.3.0

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Digital Sight Series

Application DS-L4 Ver1.4.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Mac)

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Windows)

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.1 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.1

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Digital Sight Series

Application DS-L4 Ver1.5.2

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Digital Sight Series

Application DS-L4 Ver1.5.3

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.2 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.4

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Digital Sight Series

Application DS-L4 Ver1.5.5

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Digital Sight Series

Application DS-L4 Ver1.5.6

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Digital Sight Series

Application DS-L4 Ver1.5.7

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Digital Sight Series

Application DS-L4 Ver1.5.8

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Digital Sight Series

Application DS-L4 Ver1.5.11

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Digital Sight Series

Digital Sight 1000 Ver3.18

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Digital Sight Series

Digital Sight 10 Ver1.10

Download

Digital Sight Series

Digital Sight 10 Ver1.20

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Digital Sight Series

Digital Sight 10 Ver1.30

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Digital Sight Series

Digital Sight 10 Ver1.40

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Digital Sight Series

Digital Sight 10 Ver1.50

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Digital Sight Series

Digital Sight 50M Ver1.30

Download

Accessories

HG Precentered Fiber Illuminator

Control software Fiber Controller (Ver1.0.1)

Download

Multiple Products

Microscope USB Communication Driver

micusb Ver3.0.1.13 (64bit)

Download

Microscope USB Communication Driver

micusb Ver3.0.1.14 (64bit)

Download

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Other Regions

Resource Centre

Brochures

General Brochures

X-Ray CT

Laser Radar

Video Measuring Systems

Manual Measuring

Industrial Microscopy

Case Studies

REM Surface Engineering smooths out issues using Nikon’s micro X-ray CT scanning

Nikon’s MCT225 brings CT clarity to Tamron’s lens analysis

Nikon’s MCT225 X-ray technologies transform Tochigi Nikon’s plastic moulding

Nikon’s iNEXIV video measuring system gets the stamp of approval from IntriPlex Technologies

Korean steelmaker’s R&D centre invests in X-ray CT for vehicle weld inspection

Nikon introduces fast, automated system for inspecting wafer ID codes

Rapid, low-cost inspection of semiconductor wafers

Whether on the track or in the shop, Nikon’s Video Measuring System helps Roush Yates Engines go faster

University extends Finland’s X-ray CT infrastructure

Integrated circuits inspected faster and more accurately with a Nikon microscope

White Papers

Laser Radar heralds a paradigm shift in automotive metrology

APDIS Laser Radar: a paradigm shift away from CMMs for absolute non-contact measurement

Software

Industrial Microscopes

Stereo Microscopes

Imaging Software

Cameras for Microscopes

Accessories

Multiple Products