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Welcome to our download center. Browse and download the latest brochures and case studies. Are you interested in our software? Please fill out the form to request access.

Support and Services

Brochures

General Brochures

X-Ray CT

Laser Radar

Video Measuring Systems

Manual Measuring

Industrial Microscopy

General Brochures

Nikon Metrology Solutions Brochure

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Industrial Instruments General Catalogue

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X-Ray CT

XT H Series

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XT H 225 ST 2x

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Configurable X-ray CT Systems

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Automated CT

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MCT 225

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X-ray CT Inspection Services

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LiB Overhang Analysis

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VOXLS 40 C 450

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High.Contrast Filter

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XT V Series

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Laser Radar

APDIS Laser Radar

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APDIS Automotive

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APDIS Gap & Flush

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APDIS Intelligent Quality Stations

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Video Measuring Systems

VMZ-S Series

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VMA Series

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VMZ-K Series

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VMZ-H3030

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Remote Control SDK

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Manual Measuring

Measuring Microscopes MM Series

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Profile Projectors

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Autocollimator

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Digimicro

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Industrial Microscopy

Stereo Microscopes

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Upright Microscopes L-Series

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Upright Microscopes LV-N Series

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Inverted Microscopes MA Series

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Upright POL Microscopes

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Wafer Loader for IC Inspection NWL200

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Digital Cameras for Microscopes

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NIS Elements

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Microscope Components

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Case Studies

Rapid, low-cost inspection of semiconductor wafers

The introduction of a programmable video measuring system with automatic handling of semiconductor wafers by the Industrial Metrology Business Unit…

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Whether on the track or in the shop, Nikon’s Video Measuring System helps Roush Yates Engines go faster

In North American auto racing circles, any discussion about horsepower must include Roush Yates Engines, which will soon celebrate its…

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University extends Finland’s X-ray CT infrastructure

Between 1st May, 2019 and 30th April, 2022, the University of Eastern Finland established Tomolab, a new X-ray CT (computed…

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Integrated circuits inspected faster and more accurately with a Nikon microscope

Headquartered in Cambridge, UK and with a production facility 200 miles north in Sedgefield, PragmatIC Semiconductor (www.pragmaticsemi.com) is a world…

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Video measuring system for real-time QC of lead frames packaging process

Lead frame is the most cost-effective interconnect technology for the fabrication of integrated circuits (ICs) and other electronic devices, and…

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Nikon automated X-ray CT accelerates the Natural History Museum of London’s research, archiving, and industrial services

The Natural History Museum in London, UK The Natural History Museum (NHM) in London is one of the few…

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Video measuring machine doubles the performance of quality control of a medical product manufacturer

“We based our purchase decision on the experiences of other customers who told us that Nikon’s products provide effective…

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Microscope protects samples from contamination

A classic microscope has been replaced with a new Nikon Metrology SMZ745 binocular model with a zoom range of 0.67x to 5x and its generous working distance of 115 mm.

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Laser Scanning: The Powerful, Flexible Tool of Choice for Advanced Manufacturing

Laser scanners are remarkably efficient, flexible, and reliable measurement devices that can be combined with localizing technology in a variety…

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Automatic video inspection of semiconductor wafers accelerates quality control and reporting

Semikron Elektronik GmbH used several optical microscopes from Nikon Metrology to survey and inspect 6-inch semiconductor wafers for quality assurance and production optimization.

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Software

Industrial Microscopes

Stereo Microscopes

Imaging Software

Cameras for Microscopes

Accessories

Multiple Products

Industrial Microscopes

ECLIPSE L300N/ L300ND/L200N/L200ND

Setup Tool Ver1.2.1 (64bit)

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ECLIPSE L300N/ L300ND/L200N/L200ND

Setup Tool Ver1.2.1 (32bit)

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LV Series

Support Tools Ver2.3.3 (64bit)

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ECLIPSE MA200

Setup Tool Ver1.2.1 (64bit)

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ECLIPSE MA200

Setup Tool Ver1.2.1 (32bit)

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Stereo Microscopes

SMZ25/SMZ18 /SMZ1270i

Control Software SMZ Support Tools V1.4.0 (64bit)

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Imaging Software

NIS-Elements AR

Ver5.42.01 Device Updater 64bit

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NIS-Elements AR

Ver5.42.01 (64bit)

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NIS-Elements AR

Ver5.30.05 (64bit)

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NIS-Elements AR

Ver5.21.03 (64bit)

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NIS-Elements AR

Ver5.11.03 Patch01 (64bit)

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NIS-Elements AR

Ver5.11.03 (64bit)

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NIS-Elements AR

Ver5.02.03 (64bit)

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NIS-Elements BR

Ver5.42.01 Device Updater 64bit

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NIS-Elements BR

Ver5.42.01 (64bit)

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NIS-Elements BR

Ver5.30.05 (64bit)

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NIS-Elements BR

Ver5.21.03 (64bit)

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NIS-Elements BR

Ver5.11.03 Patch01 (64bit)

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NIS-Elements BR

Ver5.11.03 (64bit)

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NIS-Elements BR

Ver5.02.03 (64bit)

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NIS-Elements D

Ver5.42.01 Device Updater 64bit

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NIS-Elements D

Ver5.42.01 (64bit)

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NIS-Elements D

Ver5.30.05 (64bit)

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NIS-Elements D

Ver5.21.03 (64bit)

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NIS-Elements D

Ver5.11.03 Patch01 (64bit)

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NIS-Elements D

Ver5.11.03 (64bit)

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NIS-Elements D

Ver5.02.03 (64bit)

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NIS-Elements F

Ver5.42.01 64bit

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NIS-Elements F

Ver5.42.00 (64bit)

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NIS-Elements F

Ver5.22.00 (64bit)

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NIS-Elements F

Ver5.21.00 (64bit)

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NIS-Elements F

Ver4.60.00 (64bit)

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NIS-Elements L

Ver1.21.00 (64bit)

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NIS-Elements Viewer

Ver5.21.00 (Windows)

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NIS-Elements Viewer

Ver4.11.00 (Mac)

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Cameras for Microscopes

Digital Sight Series

Digital Sight 10 Ver1.20

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Digital Sight Series

Digital Sight 10 Ver1.10

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Digital Sight Series

Digital Sight 1000 Ver3.18

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Digital Sight Series

Application DS-L4 Ver1.5.8

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Digital Sight Series

Application DS-L4 Ver1.5.7

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Digital Sight Series

Application DS-L4 Ver1.5.6

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Digital Sight Series

Application DS-L4 Ver1.5.5

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Digital Sight Series

Application DS-L4 Ver1.5.4

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.2 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.3

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Digital Sight Series

Application DS-L4 Ver1.5.2

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Digital Sight Series

Application DS-L4 Ver1.5.1

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.1 (Android)

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Digital Sight Series

Application DS-L4 Ver1.5.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Android)

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Windows)

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Digital Sight Series

Application DS-L4 Viewer Ver1.2.0 (Mac)

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Digital Sight Series

Application DS-L4 Ver1.4.0

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Digital Sight Series

Application DS-L4 Ver1.3.0

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Android)

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Windows)

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Digital Sight Series

Application DS-L4 Viewer Ver1.1.0 (Mac)

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Digital Sight Series

Application DS-L4 Ver1.2.0

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Digital Sight Series

Firmware DS-Ri2 Ver2.11

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Digital Sight Series

Firmware DS-Qi2 Ver2.11

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Digital Sight Series

Firmware DS-Fi3 Ver1.10

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Digital Sight Series

Application DS-L4 Ver1.1.0

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Digital Sight Series

Firmware DS-Ri2 Ver2.10

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Digital Sight Series

Firmware DS-Qi2 Ver2.10

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Digital Sight Series

Firmware DS-Ri2 Ver2.00

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Digital Sight Series

Firmware DS-Qi2 Ver2.00

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Digital Sight Series

DS-L4 Viewer Ver1.0.2 (Windows)

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Digital Sight Series

Application DS-L4 Viewer Ver1.0.2 (Mac)

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Digital Sight Series

Firmware DS-Qi2 Ver1.03

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Digital Sight Series

Control Software NIS-Elements F Ver2.21 (English version)

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Accessories

HG Precentered Fiber Illuminator

Control software Fiber Controller (Ver1.0.1)

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Multiple Products

Microscope USB Communication Driver

micusb Ver3.0.1.14 (64bit)

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Microscope USB Communication Driver

micusb Ver3.0.1.13 (64bit)

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X-ray CT

Laser Radar

Video Measuring Systems

Manual Measuring

Industrial Microscopy

X-ray CT

Laser Radar

Video Measuring Systems

Manual Measuring

Industrial Microscopy

Download Centre

Brochures

General Brochures

X-Ray CT

Laser Radar

Video Measuring Systems

Manual Measuring

Industrial Microscopy

Case Studies

Rapid, low-cost inspection of semiconductor wafers

Whether on the track or in the shop, Nikon’s Video Measuring System helps Roush Yates Engines go faster

University extends Finland’s X-ray CT infrastructure

Integrated circuits inspected faster and more accurately with a Nikon microscope

Video measuring system for real-time QC of lead frames packaging process

Nikon automated X-ray CT accelerates the Natural History Museum of London’s research, archiving, and industrial services

Video measuring machine doubles the performance of quality control of a medical product manufacturer

Microscope protects samples from contamination

Laser Scanning: The Powerful, Flexible Tool of Choice for Advanced Manufacturing

Automatic video inspection of semiconductor wafers accelerates quality control and reporting

Software

Industrial Microscopes

Stereo Microscopes

Imaging Software

Cameras for Microscopes

Accessories

Multiple Products