Nikon Metrology offers advanced measurement solutions to assist those in the microelectronics sector. At SEMICON West, Nikon Metrology will feature:
- NWL Wafer Loader Series. The NWL Series is a superb line-up of semiconductor wafer loaders capable of transferring 6″ (150mm) and 8″ (200mm) diameter wafers down to a thickness of 100 microns (option) onto Nikon Eclipse L200N and LV150N microscopes or a NEXIV VMZ-S video measuring system.
- L200. This semiconductor microscope is for exceptionally precise optical inspection of wafers, reticles, and other substrates. The L200 is ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large-scale integration (LSI) electronic devices and many more applications.
- VMZs 3020. Nikon’s NEXIV video measuring system offers exceptional speed and accuracy, which yields a high throughput of parts requiring automated dimensional measurement. Flexible illumination options allow for the detection of difficult edges and features.
For more information, visit: industry.nikon.com
