Nondestructive testing and nondestructive evaluation are discrete and related processes; NDT addresses qualitative elements of measurement, while NDE focuses more on the quantitative side. Both are covered at this event, which is ASNT’s longest-running and best-rated conference. Attendees seek solutions that can inspect both the surface and interior features of components from tiny medical devices to large castings and metal parts.
To address the specific and unique needs of this audience, at this event Nikon will feature its X-Ray CT line. Offering up to a 450 kV microfocus source combined with a tight 80 µm spot size, Nikon’s X-Ray CT offers the kind of high penetrative power that attendees are looking for to peer inside dense components. Other models in the line can inspect printed circuit boards and electronics with crispness and clarity. Automated operation is an important feature for high-value applications for the audience, including first-article inspection and even 100% inspection within certain environments. Nikon’s X-Ray CT is a fit for nondestructive testing and nondestructive evaluation alike.