Nikon’s market-leading Xi Nanotech X-ray microfocus source is unique due to its exclusive integral generator design and unparalleled 160kV maximum energy and 20W true-target power.
High.Contrast Filter reveals hidden details in the radiography image by providing outstanding image quality of both high and low contrast areas in a single clear image. Operators can now identify all aspects of the sample more quickly than ever before, optimizing and increasing their productivity.
The equipment offers a best-in-class inspection area to footprint ratio, accommodates samples up to 711mm x 762mm (28”x30″) and has a large detector field-of-view (up to 25cmx20cm).
3D inspection with CT and X.Tract provides digital slicing in any orientation for full 3D component NDT, providing a high-accuracy, cost-effective CT solution for smaller components.
If you would like further details on this product or a more in-depth description, our expert team will provide you with additional information and, if required, arrange an on-site visit. Talk to us in detail about your project and our experts will advise you on the best inspection system to meet your requirements. Please fill out the form opposite and we will get in touch with you shortly.
