XC65Dx

Thanks to its patented, triple-laser configuration, the XC65Dx cross scanner captures comprehensive information about complex 3D geometric features and freeform surfaces in a single scan.

Increase Productivity for Feature Inspection and Surface Measurement

From an individual part such as a car door to a fully assembled vehicle, the XC65Dx is the ideal scanner for inspecting geometric features and freeform surfaces. Productivity is greatly improved by reducing time spent on both programming and executing scan paths.

Product Highlights

Easy Path-Programming

As geometric features or freeform surfaces can be captured in a single pass instead of multiple scans, programming of the scan paths is drastically simplified.

Boost CMM Productivity

Nikon XC65Dx scanners can be retrofitted to a wide range of CMM brands to boost the inspection productivity of existing CMM installations.

XC65Dx-LS Long Stand-Off

The XC65Dx-LS long-stand-off version allows geometry up to a distance of 170mm to be captured, gaining optimum access to difficult-to-reach features.

Core Features

Focus

XC65Dx

XC65DxXC65Dx-LS
Probing Error (MPEp)112 u00b5m (0.00047u201d)15 u00b5m (0.00060u201d)
Ball Bar Length (MPEE)24u00b5m +L/350mm
(0.00016 +L/350) (")
Multi-Stylus Test (MPEAL)39 u00b5m (0.00035u201c)
ISO Probing Form Error425 u00b5m (0.00098u201c)35 u00b5m (0.00138u201c)
ISO Probing Size Error all545 u00b5m (0.00177u201d)80 u00b5m (0.00315u201d)
ISO Probing Dispersion Value648 u00b5m (0.00189u201c)60 u00b5m (0.00236u201c)
ISO Cone Angle7115u00b0125u00b0
Scanning Speed (approx)Cross Scanner mode: 3 x 25,000 pts/su2028
Line scanner mode: 1 x 75,000 pts/su2028
75 lines/s
Width of View3x65 mm (3x2.56u201d)
Depth of View3x65 mm (3x2.56u201d)
Stand-off distance (approx.)75 mm (2.95u201d)170 mm (6.69u201d)
Dimensions155x86x142 mm (6.1x3.4x5.6u201d)
Weight (approx.)440 g (0.97 lbs)480 g (1.06 lbs)
Enhanced Scanner PerformanceESP3
Laser SafetyClass 2
Probe Head Compatibility PH10M, PH10MQ, CW43, PHS

All accuracy specifications valid for a CMM with an accuracy of 2µm + L/350 or better using manufacturer supplied test sphere. 1 Nikon Metrology test comparable to EN/ISO 10360-2 MPEP using 1ơ sphere fit. 2 Nikon Metrology test comparable to EN/ISO 10360-2 MPEE 3 Nikon Metrology test comparable to EN/ISO 10360-5 MPEAL Accuracy specifications according to ISO 10360-8:2013: 4 PForm.Sph.1×25:Tr:ODS,MPE : Maximum probing form error using 25 representative points in translatory scanning mode 5 PSize.Sph.All:Tr:ODS,MPE : Maximum probing size error All using all measured points in translatory scanning mode 6 PForm.Sph.D95%:Tr:ODS,MPL : Maximum probing dispersion value using 95% of the measured points in translatory scanning mode 7 Cone angle : Region of sphere on which the measured points are selected

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