Nikon’s market-leading Xi Nanotech X-ray microfocus source is unique due to its exclusive integral generator design and unparalleled 160kV maximum energy and 20W true-target power.
High.Contrast Filter reveals hidden details in the radiography image by providing outstanding image quality of both high and low contrast areas in a single clear image. Operators can now identify all aspects of the sample more quickly than ever before, optimizing and increasing their productivity.
The equipment offers a best-in-class inspection area to footprint ratio, accommodates samples up to 711mm x 762mm (28”x30″) and has a large detector field-of-view (up to 25cmx20cm).
3D inspection with CT and X.Tract provides digital slicing in any orientation for full 3D component NDT, providing a high accuracy, cost-effective CT solution for smaller components.
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| XT V130C Cost-effective 130kV system for inspection of electronic components | XT V160 Premium 160kV system for high accuracy X-ray and CT applications |
| Power | Power |
| Resolution | Resolution |
| Field of View | Field of View |
| CT Ready | CT Ready |
| X.Tract Ready | X.Tract Ready |
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